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| The JSM-6390LA is a high-performance, scanning electron microscope with an embedded energy dispersive X-ray analyzer (EDS) developed by JEOL which allows for seamless observation and EDS analysis. The take-off-angle for the JSM-6390LA is 35°. with an analytical working distance of 10mm. |
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| The JSM6490LA is a high performance, scanning electron microscope with an embedded energy dispersive X-ray analyzer (EDS) developed by JEOL which allows for seamless observation and EDS analysis. The take-off-angle for the JSM-6490LA is 35°, with an analytical working distance of 10mm. |
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